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Global Laboratories
Home
Industries
  • Aerospace
  • Energy
  • Industrials
  • Medical Devices
  • Transportation
SERVICES
  • Manufacturing
  • Mechanical Testing
  • Surface Testing
  • Advanced Testing
  • Failure Analysis
  • Non-Destructive Testing
  • Structure Composition
  • Elemental Analysis
ABOUT
  • About us
  • Careers
  • Contact us
  • FAQs
24 HOUR QUOTE
More
  • Home
  • Industries
    • Aerospace
    • Energy
    • Industrials
    • Medical Devices
    • Transportation
  • SERVICES
    • Manufacturing
    • Mechanical Testing
    • Surface Testing
    • Advanced Testing
    • Failure Analysis
    • Non-Destructive Testing
    • Structure Composition
    • Elemental Analysis
  • ABOUT
    • About us
    • Careers
    • Contact us
    • FAQs
  • 24 HOUR QUOTE
  • Home
  • Industries
    • Aerospace
    • Energy
    • Industrials
    • Medical Devices
    • Transportation
  • SERVICES
    • Manufacturing
    • Mechanical Testing
    • Surface Testing
    • Advanced Testing
    • Failure Analysis
    • Non-Destructive Testing
    • Structure Composition
    • Elemental Analysis
  • ABOUT
    • About us
    • Careers
    • Contact us
    • FAQs
  • 24 HOUR QUOTE

Structure Composition

Decoding Materials in Micro to Nano Scale

Explore the pinnacle of material characterisation with our cutting-edge structure composition testing services at Global Laboratories. Our seasoned team of engineering experts, well-versed in mechanical, electrical, and civil engineering, is committed to delivering top-notch solutions that surpass your expectations. Whether you're tackling a complex project or seeking operational enhancements, we possess the skills and expertise to ensure your success.


Unlock the secrets at the micro to nano scale through advanced techniques such as SEM (Scanning Electron Microscopy), EBSD (Electron Backscatter Diffraction), TEM (Transmission Electron Microscopy), and more. At Global Laboratories, we're dedicated to pushing the boundaries of structural analysis, providing you with unparalleled insights into material composition and performance."

Our Structure Composition Capabilities

Scanning Electron Microscopy

Scanning Electron Microscopy

Scanning Electron Microscopy

Our team offers electron backscatter diffraction (EBSD) testing services. EBSD analysis provides crystallographic and microstructural data about samples. This data can help identify phase, grain size, and crystal structure.  Here’s what we includes: 

  • JSM-7001F、JSM-IT700HR、JSM-7610F
  • TEM Tecnai-G2-F20 
  • HRTEM
  • Lithium-ion battery system TEM
  • FIB (Helios 5CX)  

Our services including:  

  • Sample preparation  (from 50 GBP per sample)
  • SEM/EBSD/TEM/FIB/EDS  (from 80 GBP per map, )
  •  Image Analysis and reporting
  •  Micro-Raman test  60 GBP per point 


X-Ray Diffraction

Scanning Electron Microscopy

Scanning Electron Microscopy

We offer thespecialised knowledge of our physicians and engineers, along with our state-of-the-art analytical equipment, to provide customised support in X-ray crystallography analysis. This approach can be integrated with elemental analysis techniques (such as ICP, Ion Chromatography, etc.), thermal analysis methods, and XRD to collect comprehensive data on your materials.


Residual stress analysis from 80 GBP per point and 40 GBP per additional layer


Metallography

Scanning Electron Microscopy

Metallography

We bring together the specialised expertise of our skilled professionals and cutting-edge analytical equipment to offer tailored solutions in metallography. Our service includes meticulous grain size testing and detailed microscopic examinations of microstructures. Using various magnifications, including low and high magnification, as well as techniques like polarised light and phase contrast, we provide comprehensive insights into the characteristics of your materials. 


Grain size testing from 120 GBP per sample

 

Our team of over 4,200 Engaged Experts in Europe, Asia and North America are ready to help you.

24 HOUR QUOTE

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GLOBAL LABORATORIES LTD

124 City Road, London, EC1V 2NX

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